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Features:

● Compatible to UVC and USB3 Vision
● Sony Pregius and STARVIS sensors
● Onboard image pre-processing

 

Features:

● Compatible to UVC and USB3 Vision
● Sony Pregius and STARVIS sensors
● Onboard image pre-processing

 

Features:

● Reversible Type-C port connection
● Sony STARVIS and Pregius CMOS sensors
● Single-board cameras

 

Features:

● Reversible Type-C port connection
● Sony STARVIS and Pregius CMOS sensors
● Single-board cameras

 

Features:

● Reversible Type-C port connection
● Sony STARVIS and Pregius CMOS sensors
● With trigger and I/O
● Single-board cameras

 

Features:

● Reversible Type-C port connection
● Sony STARVIS and Pregius CMOS sensors
● With trigger and I/O
● Single-board cameras

 

Features:

● RJ45 or ix Industrial® Ethernet interface
● Sony Pregius 9 and 12 megapixel
● Frame buffer and onboard image pre-processing

 

Features:

● RJ45 or ix Industrial® Ethernet interface
● Sony Pregius 9 and 12 megapixel
● Frame buffer and onboard image pre-processing

 

Features:

● Compatible to UVC and USB3 Vision
● Sony Pregius and Pregius S CMOS sensors
● Onboard image pre-processing

 

Features:

● Compatible to UVC and USB3 Vision
● Sony Pregius and Pregius S CMOS sensors
● Onboard image pre-processing

 

Features:

● Flat compact housing
● Resolution 7728 x 5368
● C/CS-Mount

 

Application:

  • Various large-format inspections
  • Location recognition

Application:

  • High precision
  • Large size measurement

Benefits:

  • Customize design to the length & width
  • High Uniformly
  • Suitable for large area

Application:

  • Precision parts size measurement
  • Edge damage detection
  • Scratches on the surface of transparent objects

Application:

  • Precision parts size measurement
  • Edge damage detection
  • Scratches on the surface of transparent objects

Benefits:

  • High brightness
  • High LED density
  • Special materials can effectively eliminate image ghosting
  • High uniformity

Application:

  • High reflective surface scratch detection
  • QR code detection
  • Chip, wafer breakage detection